Peak Analytical, Inc.

failure analysis, investigative engineering, and a range of problem solving services

Peak Analytical Inc

Non-Destructive Evaluation

Peak Analytical, Inc. utilizes Non-Destructive Evaluation (NDE) to provide accurate information on the failure site, failure mechanism, and root cause of failure without causing any damage to the product or obscuring or removing valuable information.

Optical Microscopy

Optical microscopy is the most rapid and convenient approach in locating and identifying most external defects. When used in conjunction with micro-sectioning, it can be a very powerful tool. We currently have optical inspection tools over a broad range of magnifications, with digital imaging for optimum results.

Fourier Transform Infrared Spectroscopy

Fourier transform infrared (FTIR) spectroscopy is a powerful analytical technique for characterizing and identifying organic molecules. Chemical bonds and the molecular structure of organic compounds can be identified through the IR spectrum, thus giving us the ability to determine the source of organic contaminants in areas such as electrical contacts, metallization lines, magnetic disk drives and die surfaces.

Energy Dispersive Spectroscopy

We perform chemical analysis using energy dispersive spectroscopy (EDS), which is a technolgy that measures the energy and intensity distribution of X-ray signals generated by the electron beam striking the surface of the specimen. The elemental composition at a point, along a line, or in a defined area can be easily determined to a high degree of precision (~0.1 wt.%).
In the failure analysis of electronic products, EDS can be crucial in determining solder composition, examining plating quality, determining the location and source of contamination, and performing reverse engineering.

Scanning Electron Microscopy

We have access to scanning electron microscopy facilities. In failure analysis, electron microscopy is a natural extension of optical microscopy. The use of electrons instead of a light source provides much higher magnification (>10,000x), unique imaging, and the opportunity to perform elemental analysis and phase identification.

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